May 8-10, 2018
This updated course is an intensive and comprehensive presentation of all aspects of the measurement of microwave antenna characteristics. Instruction presents techniques for the determination of antenna radiation patterns, directivity, gain, polarization, and impedance. Topics include the design, use, and evaluation of all capabilities used for antenna measurements, including outdoor ranges, compact ranges, anechoic chambers, and all near-field scanning methods in current use. Experimental results obtained from measured data illustrate these concepts. The course covers antenna measurements in the microwave and millimeter-wave frequency ranges and the instrumentation required for these measurements. Additional specialized topics include phased-array testing and alignment, antenna diagnostic methods, phaseless near field measurements, synthetic aperture techniques, measurements of wireless antennas, electromagnetic interference and compatibility issues, and radome testing. Participants also tour the UCLA Antenna Range and view an example of a near-field scanning facility covered in the course.
The course benefits engineers, scientists, engineering managers, and practicing antenna measurement technicians who need to quickly and thoroughly understand the principles of state-of-the-art antenna measurement techniques.
Each lecturer is a recognized expert in antenna measurements with distinguished contributions in the development of modern antenna measurement techniques. All were recruited from private industry, academia, and government agencies.
This is the 44th anniversary of the course, which was presented for many years at California State University, Northridge, under the enduring leadership of the late Professor Edmond Gillespie.
Lecture notes are distributed on the first day of the course. These notes are for participants only and are not for sale
Coordinator and Lecturer
Yahya Rahmat-Samii, PhD, Distinguished Professor, holder of the Northrop-Grumman Chair in Electromagnetics, member of the US National Academy of Engineering (NAE), and the former chairman of the Electrical Engineering Department at the University of California, Los Angeles (UCLA). Dr. Rahmat-Samii was the 1995 President of IEEE Antennas and Propagation Society (AP-S) and also served as the IEEE Distinguished Lecturer. His research contributions cover a diverse area of electromagnetics and antennas. Dr. Rahmat-Samii has received numerous awards, including 1985 Fellow of IEEE, 1992 and 1995 IEEE AP-S Wheeler Best Application Prize Paper, 1999 University of Illinois ECE Distinguished Alumni Award, IEEE Third Millennium Medal, AMTA’2000 Distinguished Achievement Award, 2001 recipient of an Honorary Doctorate from the University of Santiago de Compostela, Spain, 2001 elected Foreign Member of the Royal Flemish Academy of Belgium for Science and the Arts, 2002 Technical Excellence Award from JPL, 2005 URSI Booker Gold Medal, 2007 Chen-To Tai Distinguished Educator Award of IEEE AP-S, 2007 Edmond S. Gillespie Fellow of AMTA, 2009 IEEE AP-S Distinguished Achievement Award, 2010 UCLA School of Engineering Lockheed Martin Excellence in Teaching Award, 2011 UCLA Distinguished Teaching Award and the 2011 IEEE Electromagnetics Award. Prof. Rahmat-Samii is the designer of the IEEE AP-S logo which is displayed on all IEEE AP-S publications.
Donald G. Bodnar, PhD, President of Biltmore Enterprises, Inc. Dr. Bodnar has designed, analyzed and performed polarization characterization of many antenna types including scanning reflector antennas and has performed antenna and RCS measurements using compact range, near-field, and far-field measurement techniques. He has been a fellow of AMTA (Antenna Measurement Techniques Association) since 2012, was the 2010 President of AMTA, has been a Life Fellow of the IEEE since 2008, was the 1994 President and 1993 Vice President of the IEEE AP-S (Antennas and Propagation Society), served as Chairman of the IEEE Antenna Standards Committee from 1983 to 1994, and is the author or co-author of over 100 publications. From 1999 to 2013 Dr. Bodnar was at MI Technologies rising to the position of Vice President for New Business Development, from 1997 to 1999 he was Chief Scientist Sensors Directorate, United States Air Force Research Laboratory, from 1996 to 1997 he was Chief Scientist, United States Air Force Rome Laboratory and from 1968 to 1996 he was at the Georgia Institute of Technology where progressed from a Research Engineer to Acting Laboratory Director.
Zhong Chen, MSEE, Director of RF Engineering at ETS-Lindgren, located in Cedar Park, Texas. He has over 20 years of experience in RF testing, anechoic chamber design, as well as EMC antenna and field probe design and measurements. He is an active member of the ANSI ASC C63® committee and Chairman of Subcommittee 1 which is responsible for the antenna calibration and chamber/test site validation standards. He is chairman of the IEEE Standard 1309 committee responsible for developing calibration standards for field probes, and IEEE Standard 1128 for absorber measurements. His research interests include measurement uncertainty, time domain measurements for site validation and antenna calibration, and development of novel RF absorber materials. Zhong Chen received his M.S.E.E. degree in electromagnetics from the Ohio State University at Columbus. He may be reached at email@example.com.
Michael D. Foegelle, PhD, Director of Technology Development at ETS-Lindgren in Cedar Park, Texas. He has more than 20 years of test and measurement experience in RF and wireless. He received his Ph.D. in physics from the University of Texas at Austin. Dr. Foegelle has been actively involved in standards development on the American National Standards Institute (ANSI) Accredited Standards Committee C63 on electromagnetic compatibility, CTIA Certification Program Working Group, Wi-Fi Alliance, WiMAX Forum, IEEE 802.11, and 3GPP. He has served as chair or vice-chair of various working groups in those organizations and currently co-chairs the joint CTIA/Wi-Fi Alliance Converged Wireless Group and the CTIA OTA Measurement Uncertainty Subgroup. He has authored or co-authored numerous papers in the areas of Electromagnetics, EMC, Wireless Performance Testing, and Condensed Matter Physics, holds several patents on wireless and electromagnetic test methods and equipment, and is dedicated to advancing the state of the art in radiated RF testing of emerging wireless technologies. He may be contacted at (512) 531-6444 or firstname.lastname@example.org.
Per O. Iversen, MSEE, Chief Executive Officer, ORBIT/FR Inc., Horsham, Pennsylvania. Mr. Iversen has nearly 20 years of experience in the area of applied electromagnetics and antennas. Prior to his current position, he was chief technology officer with SATIMO SA, Kennesaw, Georgia, where he contributed to the development of multiple probe antenna measurement systems for a wide range of applications. He also worked for several years at ESTEC, the Technology Centre of the European Space Agency, Noordwijk, Netherlands, where he managed antenna development programs for both terrestrial and spaceborne applications. Mr. Iversen is a member of the Board of Directors for the Antenna Measurement Techniques Association.
Introduction to Antennas (Bodnar)
Antenna pattern terminology, types of antennas, representation of electromagneticfields, coordinate systems, patterns, gain, directivity, effective area, andpolarization.
INTRODUCTION TO FAR-FIELD (Bodnar)
Field regions, frequency regimes, radiation patterns, the far-field criterion,antenna pattern measurements, display of antenna data, Friis transmission formula,range power budget, basic polarization measurement, and types of antenna ranges.
GAIN & DIRECTIVITY (Bodnar)
Measurement of gain by comparison to standards, availability of gain standards,3-antenna absolute method, measurement of directivity, pattern integration,measurement errors.
ANTENNA FAR-FIELD & COMPACT RANGE INSTRUMENTATIONS (Bodnar)
Antenna measurement receivers, transmitters, positioners, control systems, andrecorders; automated systems; data acquisition; and analysis and display. Single reflector, dual-reflector, and compensated compact ranges; reflector surfaceaccuracy and measurement; reflector edge treatment; test zone specifications andevaluation; numerical modeling of compact ranges; compact ranges for RCSmeasurements; and feeds for compact range systems; and absorber treatment.
DESIGN & EVALUATION OF FAR-FIELD & COMPACT RANGES (Bodnar)
Free space, elevated and ground reflection ranges; antenna positioners; in-situmeasurements; model measurements; spherical coordinate antenna ranges; moveable andfixed line-of-sight ranges; achieving uniform plane-wave illumination; control ofunwanted radiation; design equations for ground reflection and elevated ranges; andevaluation of far-field ranges.
EM VIEW OF ANTENNA MEASUREMTNS (Rahmat-Samii)
Historical background, fundamentals, coordinate systems and wave equation solutions,equivalence theorem, equivalent sources, Huygen’s principle, and overview ofnear-field measurements.
NEAR-FIELD MEASUREMENTS OVERVIEW (Rahmat-Samii)
Planar transmission equation and probe correction; scattering parameters and antennagain, polarization, and pattern; practical implementation of planar geometries;range power budget; setup and initial testing; typical results; measurement errors;and near-field measurement of EIRP and saturating flux density.
OPTIMAL SAMPLING OF ANTENNA NEAR-FIELD DATA (Rahmat-Samii)
Review of sampling in Fourier signal processing, band-limited feature of radiationfield, interpolation with cardinal functions, interpolation from minimal number ofsamples, interpolation with non-uniformly spaced samples, construction of optimumsampling function, representative case studies.
POLAR & BIPOLAR PLANAR NEAR-FIELD SCANNING (Rahmat-Samii)
Plane-polar and bipolar near-field measurement techniques, concepts andimplementation, data processing methods, representative reflector and array antennameasurements.
DIAGNOSTICS AND PHASELESS MEASUREMENTS OF ARRAYS (Rahmat-Samii)
Holographic image formation; phase retrieval and phaseless measurement techniques,representative array antenna diagnostics, simulations and measurements.
IMPLEMENTATION OF VARIOUS MODERN NEAR-FIELD SYSTEMS(1) (Per Iversen)
Overview of NF system types; examples of typical planar, cylindrical, and sphericalnear-field test systems; mechanical requirements; RF subsystems requirements; andsoftware requirements.
IMPLEMENTATION OF VARIOUS MODERN NEAR-FIELD SYSTEMS(2) (Per Iversen)
Multiple probe antenna measurements–background, probe array design challenges, probe array calibration methods, measurement uncertainties specific to probe arrays, examples of test facilities and applications.
ERROR ANALYSIS IN NEAR FIELD SYSTEMS (Per Iversen)
Methodology and goal of uncertainty error analysis; types of error budgets; the NIST 18-term error budget for PNF, CNF, and SNF systems; discussion of specific error terms; and case studies.
ANECHOIC CHAMBERS (Chen)
Understanding the RF absorbers, design and evaluation methods for tapered andrectangular chambers, anechoic chamber layouts, anechoic chamber quiet zoneevaluation methods, and guidelines for chamber accessories.
EMI/EMC TESTING (Chen)
Overview of electromagnetic compatibility, commercial and military EMC testing,radiated emission measurement, radiated immunity/susceptibility measurement, EMCtest site facility requirements, test site acceptance, and summary.
WIRELESS TESTING OVERVIEW (FOEGELLE)
Introduction to over-the-air radiated performance testing of wireless devices based on traditional antenna pattern measurement techniques to determine total radiated power and total isotropic sensitivity for various radio access technologies.
WIRELESS TESTING FOR MIMO (FOEGELLE)
Introduction to MIMO and MIMO over-the-air testing, demonstrating how modern radios rely on more than just individual antenna performance for enhanced communication.
WIRELESS TESTING OF 5G (FOEGELLE)
Introduction to the 5G New Radio and how enhanced concepts like beamforming and new communication bands in the millimeter wave region of the spectrum will drastically alter wireless communication and correspondingly the tests required to evaluate the operation and performance of these devices.
ANTENNA LAB TOUR, RECEPTION, WRAP-UP & DISMISSAL
Tour of the UCLA Antenna Ranges: Indoor far-field, Planar Bi-polar near field, mm-wave Table-top Planar bi-polar near field and Spherical near field. Reception, distribution of course completion certifications and dismissal.
Dates: May 8-10 (Tue-Thurs)
Time: 8am-5pm (subject to adjustment after the first class)
Location: G33 West
Course No: EC 810.70
Units: 1.8 CEU
For more information contact the Short Course Program Office:
email@example.com | (310) 825-3344 | fax (310) 206-2815